Run given test function per active device per supported op type * per burst size. */
| 3051 | * per burst size. |
| 3052 | */ |
| 3053 | static int |
| 3054 | run_test_case(test_case_function *test_case_func) |
| 3055 | { |
| 3056 | int ret = 0; |
| 3057 | uint8_t dev; |
| 3058 | |
| 3059 | /* Alloc op_params */ |
| 3060 | struct test_op_params *op_params = rte_zmalloc(NULL, |
| 3061 | sizeof(struct test_op_params), RTE_CACHE_LINE_SIZE); |
| 3062 | TEST_ASSERT_NOT_NULL(op_params, "Failed to alloc %zuB for op_params", |
| 3063 | RTE_ALIGN(sizeof(struct test_op_params), |
| 3064 | RTE_CACHE_LINE_SIZE)); |
| 3065 | |
| 3066 | /* For each device run test case function */ |
| 3067 | for (dev = 0; dev < nb_active_devs; ++dev) |
| 3068 | ret |= run_test_case_on_device(test_case_func, dev, op_params); |
| 3069 | |
| 3070 | rte_free(op_params); |
| 3071 | |
| 3072 | return ret; |
| 3073 | } |
| 3074 | |
| 3075 | |
| 3076 | /* Push back the HARQ output from DDR to host */ |
no test coverage detected