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hub / github.com/F-Stack/f-stack / test_combined_data_walkthrough

Function test_combined_data_walkthrough

dpdk/app/test/test_pdcp.c:2075–2102  ·  view source on GitHub ↗

Source from the content-addressed store, hash-verified

2073#define MAX_DATA_LEN 9000
2074
2075static int
2076test_combined_data_walkthrough(struct pdcp_test_conf *test_conf)
2077{
2078 uint32_t data_len;
2079 int ret;
2080
2081 ret = test_combined(test_conf);
2082 if (ret != TEST_SUCCESS)
2083 return ret;
2084
2085 if (!silent)
2086 silent = true;
2087
2088 /* With the passing config, perform a data walkthrough test. */
2089 for (data_len = MIN_DATA_LEN; data_len <= MAX_DATA_LEN; data_len++) {
2090 test_conf_input_data_modify(test_conf, data_len);
2091 ret = test_combined(test_conf);
2092
2093 if (ret == TEST_FAILED) {
2094 printf("Data walkthrough failed for input len: %d\n", data_len);
2095 return TEST_FAILED;
2096 }
2097 }
2098
2099 silent = false;
2100
2101 return TEST_SUCCESS;
2102}
2103
2104#ifdef RTE_LIB_EVENTDEV
2105static inline void

Callers

nothing calls this directly

Calls 3

test_combinedFunction · 0.85
printfFunction · 0.50

Tested by

no test coverage detected